Spotlight Aurora FT-IR Microscope
Model: Spotlight AuroraA dual-optical FT-IR microscope: 900 μm × 900 μm high-definition imaging plus a 10 mm × 10 mm widefield view, so you locate first and measure micro-areas second. Z-STACK depth-of-field extension lets rough and curved samples be measured without preparation, while real-time particle recognition and library matching cut contaminant identification from hours to minutes. Coaxial IR and visible optics with a magnetic micro-ATR make analysis point-and-shoot.
Specifications
| Spectral range | 7800 – 600 cm⁻¹ |
|---|---|
| IR imaging | 900 μm × 900 μm high-definition imaging + 10 mm × 10 mm widefield imaging |
| Spatial resolution | better than 7 μm |
| Signal-to-noise | better than 35000:1 (point mode, 4 cm⁻¹, 2 min, MCT) |
| Visible imaging | Dual 5-megapixel cameras, HD / widefield systems |
| Detector | MCT, active area ≥ 80 × 80 μm; optional LN2 MCT / room-temperature TE-MCT |
| Detector expansion | Up to 3 detectors installed, motorised beam switching |
| Sampling modes | Transmission, reflection, micro-ATR (magnetic, coaxial IR/visible) |
| Stage | Motorised reciprocating stage, sample thickness up to 60 mm |
| Depth technology | Z-STACK focus extension, 3D reconstruction of curved samples |
| Architecture | Modular split system, couples with Spectrum series spectrometers |
Features
- Stage accepts samples up to 60 mm thick: circuit boards, odd-shaped parts and thick sections need no preparation
- 900 μm × 900 μm HD plus 10 mm × 10 mm widefield imaging: survey the whole sample, then zoom to the micro-area
- Z-STACK depth extension with automatic depth tuning focuses rough and curved surfaces and outputs 3D topography
- Real-time automated particle recognition and spectral library matching turn hours of identification into minutes
- Magnetic micro-ATR on a coaxial IR/visible path — what you see is what you measure, tool-free tip removal
- Spatial resolution better than 7 μm reveals micrometre-scale chemical differences
- Three detectors inside with motorised switching: LN2 MCT for trace work, room-temperature TE-MCT for routine screening
- Modular split architecture pairs with Spectrum series FT-IR hosts and can be upgraded to NIR imaging
Applications
- Environment and microplastics: automated particle counting, polymer identification and chemical imaging
- Pharmaceuticals: tablet authenticity, API distribution, trace impurities and foreign matter
- Materials: multilayer films, coating cross-sections, polymer blends and defects
- Semiconductor and electronics: wafer and PCB contaminant identification
- Forensics and documents: paint chips, fibres, drugs, explosives, paper and ink
- Life science: lipid and protein distribution in tissue sections, bone mineralisation studies